ATOMIC FORCE MICROSCOPY

研究Research

我的研究页只放我真正做过、真正关心的方向。当前核心是原子力显微镜，尤其是导电 AFM、纳米尺度电学成像以及测量伪影与校准。

This page only includes research I actually work on. My current focus is atomic force microscopy, especially conductive AFM, nanoscale electrical imaging, measurement artifacts and calibration.

研究主题Themes

原子力显微镜

Atomic force microscopy

如何理解探针、表面、反馈和信号之间的耦合，并让图像真正对应被测性质。

Understanding probe–surface–feedback coupling so images better reflect the property being measured.

导电 AFM 与电学成像

Conductive AFM & electrical imaging

关注纳米尺度电流成像的可靠性，以及形貌、接触和仪器因素如何影响最终信号。

Reliability of nanoscale current mapping and how topography, contact and instrumentation affect the signal.

测量伪影与校准

Artifacts & calibration

识别“看起来像材料性质、实际上来自测量系统”的信号，并建立可验证的校准方法。

Identifying signals that look like material properties but originate from the measurement system, then building verifiable calibration methods.

论文Publication

代表性工作Selected work

2024 · Nano Research · Vol. 17 · 6509–6517

A universal calibration method for eliminating topography-dependent current in conductive AFM and its application in nanoscale imaging

这项工作聚焦于导电 AFM 中形貌相关的电流伪影，并提出用于消除该影响的通用校准方法。它也代表我更长期关心的问题：测量结果里，到底有多少来自样品，有多少来自仪器与测量过程本身。

This work addresses topography-dependent current artifacts in conductive AFM and proposes a universal calibration method. More broadly, it reflects a recurring question in my research: how much of a measurement comes from the sample, and how much comes from the measurement process itself?

在 Springer 阅读Read on Springer ↗

技术写作Technical writing

把 AFM 写给更多人看懂Explaining AFM beyond the paper

除了论文，我也长期在知乎「字符序列」写原子力显微镜相关内容。个人网站以后会把其中值得长期保存的内容逐步整理回来。

Beyond papers, I have written extensively about AFM on Zhihu under “字符序列”. Selected pieces can gradually be republished here as durable reference notes.

查看知乎Visit Zhihu ↗